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Safety Standard ISO 26262 and Its Implications In Testing of Integrated Circuits used in Automobiles_Blog_header

The use of semiconductors in automobiles is rapidly increasing, paralleling the advancement of automotive technology through AI techniques and stringent safety standards. A key framework guiding these developments is the ISO 26262 standard, which addresses functional safety levels in automobiles through parameters such as the Automotive Safety and Integrity Level (ASIL).

Understanding ASIL Parameters

The ASIL parameters—ASIL A, ASIL B, ASIL C, and ASIL D—provide insights into the safety grades for automotive systems. Examples of ASIL grades include:

  • ASIL A: Body controls, rear lights, heating, and cooling.
  • ASIL B: Rearview camera and brake lights.
  • ASIL C: Battery management, suspension, and cruise control.
  • ASIL D: Power steering and airbags.

The ASIL grades are determined through a process known as Hazard Analysis and Risk Assessment (HARA), where components, modules, or systems are subjected to simulations to identify potential hazards.

Importance of ASIL Categorization

ISO 26262 safety certification necessitates ASIL categorization through HARA. For integrated circuits in automobiles, all ASIL categorizations apply to semiconductor modules and systems. This requirement shifts the focus from Defective Parts Per Million (DPPM) to Defective Parts Per Billion (DPPB) in manufacturing defects.

Robust Fault Models in Semiconductor Testing

Current fault models in design for test (DFT) are insufficient to address the stringent requirements. More robust models, such as Cell-Aware fault models at the transistor level, are necessary to minimize manufacturing defects and meet safety standards. Additionally, developing exclusive architectures that monitor automobile parameters can further minimize risks by reducing hazard severity and bringing the vehicle to a fail-safe state.

Hazard Analysis and Risk Management

Hazard analysis and risk management in automotive design involve assessing random faults, akin to fault simulation in traditional DFT. Techniques such as Built-In Self-Test (BIST) in modules and subsystems can provide safety metrics for ASIL categorization and safety assessment.

Conclusion

The ISO 26262 standard is critical and demands serious, collaborative efforts from both the semiconductor and automotive industries. Converging on a robust safety certification process is essential to advance automotive safety and technology.

By adhering to ISO 26262, both industries can ensure the highest safety standards, leveraging advancements in semiconductors and AI to create safer, smarter vehicles for the future.

Dr. K Shiva Kumar_author_modernizechipsolutions
Senior Director - DFT | Website | + posts

Experienced Technical Manager with a demonstrated history of working in the semiconductors industry. Strong engineering professional skilled in Verilog, Integrated Circuits (IC), EDA, CMOS, and Physical Design.